Ede, Jeffrey M (2021) Deep learning in electron microscopy. Machine Learning: Science and Technology, 2 (1). 011004. ISSN 2632-2153
Ede_2021_Mach._Learn.__Sci._Technol._2_011004.pdf - Published Version
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Abstract
Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Following, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.
Item Type: | Article |
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Subjects: | Research Scholar Guardian > Multidisciplinary |
Depositing User: | Unnamed user with email support@scholarguardian.com |
Date Deposited: | 07 Dec 2023 03:42 |
Last Modified: | 07 Dec 2023 03:42 |
URI: | http://science.sdpublishers.org/id/eprint/1289 |